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美国国家标准局的Pella等制造了两种标准物SRM 1832(Al、Si、Ca、V、Mn、Co和Cu)和SRM1833(Si、K、Ti、Fe、Zn和Pb),验证了它们的元素均匀性、组成和对水的灵敏度。这两种标准物用于x射线荧光光谱仪的校正,特别是过滤介质上收集到空载颗粒物的元素分析。这种硅石基的玻璃膜厚0.5～0.6微米,是用离子束聚焦涂敷法沉积在聚碳酸酯层上的,其中含有已知量选定的元素氧化物。
Two standards, SRM 1832 (Al, Si, Ca, V, Mn, Co and Cu) and SRM1833 (Si, K, Ti, Fe, Zn and Pb) were produced by Pella et al. Of the National Bureau of Standards of the United States Elemental uniformity, composition and sensitivity to water. These two standards are used for the calibration of x-ray fluorescence spectrometers, especially the elemental analysis of the collection of empty particles on the filter media. The silica-based glass film, 0.5 to 0.6 microns thick, is deposited on the polycarbonate layer by ion beam focus coating and contains a known amount of selected elemental oxide.