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HP公司日前宣布推出用于测量振荡器和合成器相位噪声的两种系列的新型自动测量系统—HPE5500A/B。两种HPE5500系统均有一个低噪声模块测量系统(MMS)基带测试仪,采用带参考源的相位检波器法来测量高频振荡器的单边带相位噪声。用户可以在几种由工厂配置的系统之间选
HP today announced two new automated measurement systems, the HPE5500A / B, for measuring the phase noise of oscillators and synthesizers. Both HPE5500 systems have a low-noise module measurement system (MMS) baseband tester that uses a phase detector with a reference source to measure the single-sideband phase noise of a high-frequency oscillator. Users can choose between several factory-configured systems