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通过测量STN或TN液晶盒的扭曲角,提供了一种新的研究表面扭曲锚定强度的方法。根据测量得到了边界处LC指向矢与衬底磨擦之间的偏差。作者给出了关于这种偏差的理论分析。
By measuring the twist angle of the STN or TN cell, a new method to study the surface distorted anchoring strength is provided. The deviation between the LC director and the substrate friction at the boundary was obtained from the measurements. The author gives a theoretical analysis of this deviation.