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对浮结型及超结型肖特基势垒二极管静态及动态特性进行了解析及模拟。静态特性通过解析击穿电压与导通电阻之间的关系得到。反向恢复特性通过二极管电容随反向电压变化关系解释,商用混合模拟器MEDICI模拟结果表明浮结结构具有软恢复特性,软度因子为0.949。超结结构恢复特性较硬,软度因子为0.780 7。当考虑这两种耐压结构时,必须权衡静态及动态之间的关系。
Static and dynamic characteristics of floating-junction and super-junction Schottky barrier diodes are analyzed and simulated. Static characteristics are obtained by solving the relationship between breakdown voltage and on-resistance. The reverse recovery characteristic is explained by the relationship between the diode capacitance and the reverse voltage. The MEDICI simulation results of the commercial hybrid simulator show that the floating structure has a soft recovery characteristic with a softness factor of 0.949. Super-junction structure recovery characteristics of hard, softness factor of 0.7807. When considering these two pressure-resistant structures, the relationship between static and dynamic must be weighed.