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本文报道利用红外分光光度计和微机系统,采用二次测量技术,测量材料表面法向光谱发射率的基本原理和测试方法。推导出光谱发射率的计算公式,对引起测量误差的诸因素进行讨论,并实测了几种材料法向光谱发射率曲线。
This paper reports the basic principles and test methods of measuring the normal spectral emissivity of a material surface by using an infrared spectrophotometer and a computer system using a secondary measurement technique. The formula of spectral emissivity is deduced, the factors that cause measurement error are discussed, and the normal spectral emissivity curves of several materials are measured.