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欧洲设计和测试会议和展览会(ED&TC)进入第二个年头,论文重点放在更加面向应用方面.它的目标是要以电子电路设计和测试的最新进展信息来为参加会议的工业界和学术界人士服务.ED&TC于3月6日～9日在去年的会址巴黎CNIT会议和展览中心举行.这次会议第一次将以前的欧洲测试会议、欧洲设计自动化会议(EDAC)和欧洲ASIC会议组合成一个会议.去年的与会者大约有一半以上来自法国以外的地区,会议官员把这一点列举为会议取得成功的证明.今年总共有136篇论文预定在41个分会场报告,另有28篇将张贴展示.主题涉及到整个设计和测试问题,其中包括数字和系统模拟、系统综合、顺序逻辑综合、混合信号测试设计、内置的自测、静态电流(I_(DDQ))测试、现场可编程门阵列(FPGA)、多媒体和电路分区.在三个小组会议上,工业专家将论述从传统的自动测试设备到更加开放的体系结构自动测试设备(ATE)的变化,模拟与正式验证以及混合信号技术对欧洲微电子行业产生的影响.
The second year of ED & TC (European Design and Testing Conference and Exhibition) focuses on more application-oriented, and its goal is to provide industry and academia participating in the conference with the latest advances in electronic circuit design and testing ED & TC was held at the CNIT Conference and Exhibition Center in Paris last year from March 6 to 9. The conference was the first to combine the previous European Test Conference, the European Design Automation Conference (EDAC) and the European ASIC Conference More than half of last year’s attendees came from outside France, and conference officials cited this as evidence of the success of the conference, with a total of 136 papers scheduled to be reported at 41 sub-venues this year and 28 others The topics cover the entire design and testing issues including digital and system simulation, system synthesis, sequential logic synthesis, mixed signal test design, built-in self-test, quiescent current (I DDQ) testing, field programmable Gate arrays (FPGAs), multimedia, and circuit partitioning. In three panel sessions, industry experts will discuss the transition from traditional automated test equipment to a more open body Changes in the structure of automatic test equipment (ATE) effect, simulation and formal verification, and mixed-signal technology to the European microelectronics industry generated.