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与过去相比,如今有更多的电子公司转向使用廉价的ATE来满足他们对生产测试的要求。这不仅是由于这样做明显地降低了添置及运行设备的费用,而且还有其它的原因。他们转向低价的ATE是因为许多新系统能提供超过早期大系统所具有的性能。新品种的ATE之所以较好,首要的原因是它采用了一些新的测试技术。例如采用了无向量测试技术和较多地利用埋置在被测单元中的资源。大多数的廉价的ATE都作成能升级以容纳多种测试资源的基本配置形式。测试系统还可以具有实现双重任务的配备。例如,一个任务是探查工艺缺陷;另一个任务是评价最终产品的功能。
More electronics companies today are turning to cheap ATEs to meet their manufacturing test requirements than they used to. This is not only because it significantly reduces the cost of acquiring and operating equipment, but also for other reasons. They are turning to ATE for a low price because many of the new systems offer more performance than older large systems. The reason why the new breed of ATE is better is primarily because it uses some new testing techniques. For example, the use of non-vector test technology and more use of buried in the unit under test resources. Most of the cheap ATE are made into a basic configuration that can be upgraded to accommodate multiple test resources. The test system can also be equipped with dual tasks. For example, one task is to probe for process defects; another is to evaluate the functionality of the final product.