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本文为测量透明的介质片及介质膜的厚度,提供一个简易可行的办法,测量范围从1厘米至几十个波长。一、原理若用钠双线来照射迈克尔逊干涉仪,在视场中我们观察到干涉条纹的可见度将随着光程差增大(或减小),而发生“极大—极小—极大……”的周期性变化。这是因为条纹的宽度与波长成正比,不同波长照射光在干涉屏上所
This paper provides a simple and feasible method for measuring the thickness of transparent dielectric sheets and dielectric films. The measurement range is from 1 cm to several tens of wavelengths. First, the principle If the sodium double line to irradiate the Michelson interferometer, we observed in the field of view of the visibility of the interference fringes will increase (or decrease) with the optical path difference, and the occurrence of “very - very small - pole Big ... ”cyclical changes. This is because the width of the stripe is proportional to the wavelength and the light of different wavelengths illuminates the interference screen