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一、前言早在1919年,Hull就指出了利用X经-射线衍射技术(以下简称XRD)对分子化合物进行定量分析的可能性。但是,由于X-射线强度的稳定性和测量的精度不够,直到1936年Clark等,才首先利用XRD测定了大气尘埃中石英的含量。1945年用盖革计数管做检测器的XRD仪出现后,大大改善了X-射线强度测量的精度和灵敏度,加上X-射线光源的稳定性也不断提高,为XRD定量分析的研究和应用提供了实验基础。此后,尽管XRD定量分析,在精度和灵敏度还有待进一步提高,但是由于它是一种非破坏性分析方法,它可以直接对分子化合物进行定性、定量测定。随着科学技术的发展,特别是催化、半导体、环保及新材料等方面的研究工作的需要,不仅希望提供物质元素组成的情况,而且需要提供元素价态,组成分子的种类和数量等等物质结构状
I. Preface As early as 1919, Hull pointed out the possibility of using molecular X-ray diffraction (hereinafter referred to as XRD) for the quantitative analysis of molecular compounds. However, due to the stability of X-ray intensity and the lack of accuracy of the measurement, Clark et al. First used XRD to measure the content of quartz in atmospheric dust until 1936. The appearance of the XRD instrument with a Geiger counting tube detector in 1945 greatly improved the accuracy and sensitivity of the X-ray intensity measurement. In addition, the stability of the X-ray source was also continuously improved. The research and application of XRD quantitative analysis Provide the experimental basis. Since then, although the quantitative and analytical XRD needs to be further improved in accuracy and sensitivity, since it is a non-destructive analysis method, it can directly and qualitatively and quantitatively determine molecular compounds. With the development of science and technology, especially in the fields of catalysis, semiconductors, environmental protection and new materials, we not only hope to provide the composition of the material elements, but also provide the valence of the elements, the types and quantities of the constituent molecules, etc. Structure