Isoelectronic Bi atoms in InP studied at the atomic scale by cross-sectional scanning tunneling micr - 论文文献免费下载 - 皮皮文库

Isoelectronic Bi atoms in InP studied at the atomic scale by cross-sectional scanning tunneling micr

来源 :第七届铋化物半导体国际研讨会(7th International Workshop on Bismuth-contain | 被引量 : 0次 | 上传用户：baino1

【作者】

：

C.M.Krammel P.M.Koenraad M.Roy F.J.Tilley P.A.Maksym L.Y.Zhang P.Wang K.Wang Y.Y.Li S.M.Wang

【机构】

：

Department of Applied Physics, Eindhoven University of Technology, The Netherlands

【出处】

：

第七届铋化物半导体国际研讨会(7th International Workshop on Bismuth-contain

【发表日期】

：

2016年11期

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