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Nano-structurally modified inorganic chalcogenide glasses (As2S3 and Ge15.8As21S63.2) by high-energy 1.25 MeV γ-irradiation (with accumulated dose 2.41 MGy) and organic polymethylmethacrylate (PMMA) by low-energy 30-40 keV Xe+, He+, and B+ ion-implantation (with doses from 1014 to 1017 ion/cm2 and ion current density < 2 μA/cm2) are studied using positron annihilation methods-positron annihilation lifetime spectroscopy (PALS) and Doppler broadening of annihilation line (DBAL).