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Polyimide(PI) fibers have attracted more and more attention due to their properties such as outstanding thermal stability,chemical resistance,excellent mechanical properties and good irradiation resistance.Here we characterize the crystalline structure of a commercial polyimide fiber by using synchrotron two-dimensional Xray diffraction.The measurements were carried out at Beamline 14BL in Shanghai Synchrotron Radiation Facility(SSRF) with a MarCCD detector.The X-ray wavelength is 0.124nm.All the patterns were taken with a bundle of fibers oriented horizontally.The 2DXRD pattern was processed with the software Fit2D.To eliminate the influence of background noise,the data were treated by subtracting 2DXRD pattern without fibers.