Extracting quantitative nanomechanical properties from tapping mode AFM measurements

来源 :The 6th International Conference on Nanoscience and Technolo | 被引量 : 0次 | 上传用户：tw2008hr

【摘要】

：

　　Amplitude-modulated Atomic Force Microscopy(AM-AFM),also known as tapping mode or AC mode,is a proven,reliable,fast and gentle imaging method with widesprea

【作者】

：

PengCheng[1]RogerProksch[2]MartaKocun[2]AleksLabuda[2]JianjunYao[1]

【机构】

：

Oxford Instruments(Shanghai)Co.,Ltd Beijing Branch,Beijing 100005,China

【出处】

：

The 6th International Conference on Nanoscience and Technolo

【发表日期】

：

2015年期

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论文部分内容阅读

　　Amplitude-modulated Atomic Force Microscopy(AM-AFM),also known as tapping mode or AC mode,is a proven,reliable,fast and gentle imaging method with widespread applications.In this work,we introduce and demonstrate an imaging mode that combines the features of normal AM mode with the quantitative and high sensitivity benefits of frequency modulated(FM)mode.

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Extracting quantitative nanomechanical properties from tapping mode AFM measurements

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