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Investigation on Electron Mobility in Si Nanowire MOSFET Inversion Layers by Using Monte Carlo Metho
【机 构】
：
Pen-tung Sah MEMS Research Center,Xiamen University,Xiamen,Fujian,China
【出 处】
：
中国微米纳米技术学会第十届学术年会暨第一届国际会议(1st International Conference of th
【发表日期】
：
2008年12期
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