Laboratory-based Real and Reciprocal Space Imaging of the Electronic Structure of Few Layer Graphene

来源 :2013年纳米、表面和Graphene科学与技术全国会议 | 被引量 : 0次 | 上传用户：laopoxqq001

【摘要】

：

We present dark field Photoelectron Emission Microscopy and energy filtered electron emission spectromicroscopy with high spatial and wave-vector resolution on

【作者】

：

Konrad Winkler Burkhard Kr(o)mker Till Hagedorn Nicolas Barrett Edward Conrad Yang Wang

【机构】

：

OmicronNanoScience-Taunusstein(Germany)CEA,IRAMIS/SPCSI/LENSIS-Saclay(France)GeorgiaTech,Atlanta,GE,

【出处】

：

2013年纳米、表面和Graphene科学与技术全国会议

【发表日期】

：

2013年12期

【关键词】

：

Electronic structure Graphene PEEM ARPES

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We present dark field Photoelectron Emission Microscopy and energy filtered electron emission spectromicroscopy with high spatial and wave-vector resolution on few-layer epitaxial graphene on SiC(000-1) grown by furnace annealing.

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