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The research field of organic photovoltaics (OPV) has vastly increased in the past decade with impressive outcome in focus areas such as photoelectric conversion efficiencies (PCE), processing techniques, new materials, device design, and stability.The stability of both OPV devices and OPV materials has not received as much attention as the other focus areas, but has however received an increased amount of interest in recent years.In actuality an improvement in OPV stability is essential for the commercialization of OPV technology.Therefore, a detailed understanding of the degradation pathways occurring in OPV is of highest importance.OPV degradation in itself is highly complex and constitutes an analytical challenge due to the multitude of material, interfaces, and device architectures that are constantly being modified and optimized.This talk will focus on our recent OPV degradation studies in which time-of-flight secondary ion mass spectrometry (TOF-SIMS) has been utilized as the main characterization technique.The basic information of TOF-SIMS is mass spectral information i.e.chemical information.The main modes of collecting mass spectra in TOF-SIMS are: imaging (i.e.lateral distribution of the chemistry at a surface) and depth profiling (i.e.vertical distribution of chemistry in which mass spectral images are recorded as a function of depth).This, in principle, makes TOF-SIMS an ideal technique for identifying degradation mechanisms occurring in OPVs either directly or indirectly.