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本文针对金属表面渗层薄膜试样制备的困难,提出了将表面渗层移到直径为3mm 的圆片中央,以便利用双喷电解抛光法制备表面渗层薄膜试样的方法,使透射电子显微镜对渗层进行形貌观察和结构分析成为可能。利用 H-800透射电镜,获得了20Cr 钢渗铬层的形貌、第二相及位错缺陷等信息,并对进一步改善试样的抛光质量作了探讨。
In this paper, aiming at the difficulty of preparation of the sample of metal surface layering film, a method of transferring the surface layer to the center of the disk with a diameter of 3mm for the preparation of the surface layering film sample by the double jet electropolishing method is proposed. Transmission electron microscope It is possible to observe the morphology and structure of the infiltration layer. The morphology, second phase and dislocation defects of the chromized layer of 20Cr steel were obtained by H-800 transmission electron microscopy. The polishing quality of the sample was further discussed.