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高质量的扫描测试不仅仅能大大降低DPM(defectpermillion,每百万单位中的缺陷数)的等级,它们还能找出那些限制合格率提高的缺陷的根源。扫描测试与测试仿真压缩相结合,就能对生产线上的不良品提供失效诊断,这样就加快了对缺陷机制的辨识和认证。扫描测试在实际生产环境中引入了失效分析,通过这种方式,每一个通不过这项测试的不合格品就都变成了一座通往快速诊断,提高合格率的桥梁。
Not only do high-quality scan tests significantly reduce the level of defectpermillion (DPMs), they also identify the root causes of defects that limit the pass-through rate. The combination of scan test and test simulation compression can provide a failure diagnosis of defective products on the production line, thus speeding up the identification and certification of defect mechanisms. Scanning tests introduce failure analysis in the actual production environment, in which case every nonconforming product failing this test becomes a bridge to quick diagnosis and increased pass rates.