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HL-1装置放电期间,利用输样机构上GH39和Si收集探针的俄歇电子谱仪(AES)分析,观测了由器壁和孔栏溅射,蒸发出来的金属重杂质Mo,Cr和Ni等在刮离层中的空间分布,以及沉积层的深度分布。
During the discharge of the HL-1 device, Auger-Cr (AES) analysis of the GH39 and Si collection probes on the delivery mechanism was used to observe the effects of heavy metals such as Mo, Cr and Ni, etc. in the scraping layer in the spatial distribution, as well as the depth of the deposition layer distribution.