Deterministic Circular Self Test Path

• 作 者: 文科 胡瑜 李晓维
• 机 构: Key Laboratory of Computer System and Architecture Institute of Computing Technology Chinese Academy
• 出 处: Tsinghua Science and Technology
• 发表日期: 2007年S1期
• 关键词: overhead coverage nanometer deterministic attractive attain difficulty expensive

Circular self test path (CSTP) is an attractive technique for testing digital integrated circuits(IC) in the nanometer era, because it can easily provide at-speed test with small test data volume and short test application time. However, CSTP cannot reliably attain high fault coverage because of difficulty of testing random-pattern-resistant faults. This paper presents a deterministic CSTP (DCSTP) structure that consists of a DCSTP chain and jumping logic, to attain high fault coverage with low area overhead. Experimental results on ISCAS’89 benchmarks show that 100% fault coverage can be obtained with low area overhead and CPU time, especially for large circuits.

Circular self test path (CSTP) is an attractive technique for testing digital integrated circuits (IC) in the nanometer era, because it can easily provide at-speed test with small test data volume and short test application time. However, CSTP can not be able to secure high fault coverage because of difficulty of testing random-pattern-resistant faults. This paper presents a deterministic CSTP (DCSTP) structure that consists of a DCSTP chain and jumping logic, to attain high fault coverage with low area overhead. Experimental results on ISCAS ’ 89 benchmarks show that 100% fault coverage can be obtained with low area overhead and CPU time, especially for large circuits.