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在研究软X射线出现电势谱(SXAPS)和俄歇电子出现电势谱(AEAPS)的基础上,设计了一种新的芯能级谱仪——共振光电子出现电势谱仪。用内装式X光管发射的软X射线照射样品时,如X光管阳极与被照样品为相同材料,则在阳极电压达到出现电势阈值时,所产生的特征X射线将使样品发生共振吸收,而在芯能级上产生空穴,然后在退激发时发射俄歇电子。测定次级电子产额随阳极电压的变化即可得到共振光电子出现电势谱(简写为RPAPS)。用纯镍和镍合金作实验,结果表明,RPAPS对主峰以外的次峰灵敏度和对杂质元素的分辨率均优于同样条件下的SXAPS。初步分析还表明RPAPS与利用连续X射线的光电子出现电势谱(XPAPS)在机理上是不同的。
Based on the study of SXAPS and Auger electron appearance potential (AEAPS), a new ECS spectrometer - Resonance Photoelectron Potential Spectrometer was designed. When a sample is irradiated with a soft X-ray emitted by a built-in X-ray tube, if the anode of the X-ray tube is the same material as the sample being irradiated, the characteristic X-ray generated when the anode voltage reaches the potential threshold appears to cause resonance absorption of the sample , While holes are generated at the core level, and Auger electrons are then emitted upon de-excitation. Determination of secondary electron yield with the anode voltage change can be obtained by the emergence of potential photoelectron resonance potential (abbreviated RPAPS). Experiments with pure nickel and nickel alloys showed that the sensitivity of sub-peak of RPAPS to the main peak and the resolution of impurity elements were better than that of SXAPS under the same conditions. Preliminary analyzes also show that RPAPS is mechanistically different from the photoelectron potential spectrum (XPAPS) using continuous X-rays.