A diode laser spectrometer at 634 nm and absolute frequency measurements using optical frequency com

• 作 者: 伊林 袁杰 齐向晖 陈文兰 周大伟 周通 周小计 陈徐宗
• 机 构: School of Electronics Engineering and Computer Science, Peking University,
• 出 处: Chinese Physics B
• 发表日期: 2009年04期
• 关键词: absolute spectrometer instability stabilized clock harmonic microwave identical

This paper reports that two identical external-cavity-diode-laser (ECDL) based spectrometers are constructed at 634 nm referencing on the hyperfine B-X transition R(80)8-4 of 127I2. The lasers are stabilized on the Doppler-free absorption signals using the third-harmonic detection technique. The instability of the stabilized laser is measured to be 2.8 × 10-12 (after 1000 s) by counting the beat note between the two lasers. The absolute optical frequency of the transition is, for the first time, determined to be 472851936189.5 kHz by using an optical frequency comb referenced on the microwave caesium atomic clock. The uncertainty of the measurement is less than 4.9 kHz.

This paper reports that two identical external-cavity-diode-laser (ECDL) based spectrometers are constructed at 634 nm referencing on the hyperfine BX transition R (80) 8-4 of 127 I2. The lasers are stabilized on the Doppler-free absorption signals The instability of the stabilized laser is measured to be 2.8 × 10-12 (after 1000 s) by counting the beat note between the two lasers. The absolute optical frequency of the transition is, for the first time, determined to be 472851936189.5 kHz by using an optical frequency code referenced on the microwave caesium atomic clock. The uncertainty of the measurement is less than 4.9 kHz.