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随着VXI的出现,仪器部件就可望进行互换.但是,由于ATE(自动测试设备)领域没有一个统一的软件体系结构,因而特定的系统设计越来越多.结果,迫使ATE用户为解决系统集成和软件问题而费尽心血,有时其费用超过最初的硬件投资.这种行业的变化引起对具有闭路体系结构测试系统的性质和功能的开放软件部件的需求.我们参与了几个用户确定的ATE软件项目,从中使我们得出一个结论:大部分测试系统的要求是类似的,只有一点点变化.建立一个包含定义明确的接口的模块化部件的体系结构,我们就能够制作运行时模块和故障隔离模块来满足不同的用户要求.
Instrument components are expected to be interchangeable with the introduction of VXI, but due to the lack of a unified software architecture in the field of ATE (automated test equipment), there are more and more specific system designs that, as a result, forcing ATE users to address System integration and software problems and at times outweighs the initial hardware investment.This industry change has created the need for open software components with the nature and functionality of closed-circuit architecture test systems.We participated in several user-defined The ATE software project led us to the conclusion that most test system requirements are similar and only changed a bit, and by building an architecture that contains modular components with well-defined interfaces, we were able to make runtime modules And fault isolation module to meet different user requirements.