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前言这份教材共包括五章,其主旨是着眼于利用接口母线联接和组成的所谓第二代自动测试系统的设计和组建。可程控测量设备是构成第二代自动测试系统的基本砖石。第一章阐述有关测量设备的程控问题,如寻址、程控指令、数据编码格式等等。本章主要是从自动测试系统的角度来讨论问题,而并不着眼于可程控测量设备本身。关于设备本身的一些控制技术,如YIG磁调、变容管电调、PIN管电控、逻辑阵列及继电器开关阵列等等,是读者所熟悉的,于此一概略而不述。第二章阐述通用接口系统的原理和逻辑设计。这一章是文献[1]的补充和深入具体化,
Preface The textbook consists of five chapters, the main purpose is to focus on the use of interface bus connection and composition of the so-called second generation automatic test system design and formation. Programmable measuring equipment is the basic masonry for the second generation of automated test systems. The first chapter elaborates on the programming of measurement equipment, such as addressing, program control instructions, data encoding format and so on. This chapter is mainly from the point of view of automatic test system to discuss the issue, and does not focus on the programmable measuring device itself. Some of the control technology on the device itself, such as YIG magnetostrictive, varactor ESC, PIN tube electronic control, logic arrays and relay switch array, etc., are familiar to readers, in this a summary and not described. The second chapter expounds the principle and logic design of universal interface system. This chapter is supplemented and further substantiated in [1]