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测试PD器件线性的方法很多。本方法是利用同时辐射光敏面上两束光,即在适当强度的直流光上,再叠加一束辐射通量很弱的调制光。当直流光增大到一定程度时,会使交流分量输出变小以致趋于零,从而测出器件的线性范围。与其它方法比较,有简便宜行,测试准确的优点。尤为突出的是噪声,衍射、干涉、环境等干扰容易消除。它不仅适用Si—PD,而且对其它任何一种探测器均可应用。测试准确度可达1%左右。
There are many ways to test the linearity of PD devices. The method utilizes the simultaneous irradiation of two beams of light on the photosensitive surface, that is, on a direct current light of an appropriate intensity, and then superimposes a modulated light beam with a weak radiation flux. When the DC light is increased to a certain extent, the output of the AC component will become smaller and thus tends to zero, thus measuring the linear range of the device. Compared with other methods, there are simple and easy to test the advantages of accuracy. Particularly prominent is the noise, diffraction, interference, environmental interference easily eliminated. It is not only suitable for Si-PD but also for any other type of detector. Test accuracy up to 1%.