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用显微镜观察到多孔硅薄膜在空气中储存初期的龟裂现象，揭示了发光畴区周围裂缝的来源，初步探讨了龟裂现象的成因
The initial cracking phenomenon of porous silicon film stored in the air was observed with a microscope, and the source of the cracks around the luminescent domain was revealed. The cause of the cracking was preliminarily discussed