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本文以MSIS90大气模式和3D NeUoG电离层模式为大气背景,用三维射线追踪法模拟研究了太阳活动强度、地方时、掩星平面方位角对弯曲角电离层残差和温度电离层残差的影响,以及电离层残差对全球日平均温度的影响.结果表明:电离层残差是平流层顶部(35~50 km)和中间层底部(50~70 km)掩星大气温度反演的主要误差.在太阳活动活跃期,电离层残差对单一掩星事件的平流层顶部平均温度的影响可达1.8 K,中间层底部平均温度的影响可达7 K;对全球日平均温度的影响在平流层顶可达-0.6 K,在70 km高度处可达1.2 K.发展新的电离层改正方法或电离层残差修正算法对提高掩星大气反演精度和全球气候监测意义重大.
In this paper, we use MSIS90 atmospheric model and 3D NeUoG ionospheric model as atmospheric background to study the effect of azimuth of the occultation plane on the ionospheric residuals and temperature ionospheric residuals in the bending angle by the 3D ray tracing method. , And the effect of ionospheric residual on global average daily temperature.The results show that the ionospheric residual error is the main error in the inversion of the occultation temperature at the top of the stratosphere (35-50 km) and at the bottom of the middle layer (50-70 km) During the active solar activity, the ionospheric residuals can affect the mean temperature at the top of the stratosphere over a single occultation event up to 1.8 K, and the influence of the average temperature at the bottom of the middle layer can reach 7 K. The effects on global daily average temperature are affected by advection Up to -0.6 K at the top of the layer and up to 1.2 K at a height of 70 km. The development of new ionospheric correction methods or ionospheric residual error correction algorithms is of great significance for improving the precision of the retrieval of the occultation atmosphere and for global climate monitoring.