Microstructural Characteristics of Epitaxial BaSrNb0.3Ti0.7O3 Film

• 作 者: Li＇na CHENG Xiuliang MA
• 机 构: ShenyangNationalLaboratoryforMaterialsScience
• 出 处: 材料科学技术学报：英文版
• 发表日期: 2007年4期
• 关键词: 电镀物品显微镜法传递 晶体取向附生增长 金属薄膜 电子显微镜学传递 BaSrNb0.3Ti0.7O3 thin film Epitaxial growth Tr
• 基金项目: AcknowledgementsWe thank Professor H.B.Lu, Institute of Physics, Chinese Academy of Sciences, China for help with the thin film preparation. This work was supported by the National Natural Science Fou

<正>Microstructural characteristics in the BaSrNb_(0.3)Ti_(0.7)O_3 thin film,grown on SrTiO_3 substrate by computer- controlled laser molecular beam epitaxy,were characterized by means of transmission electron microscopy (TEM).It is found that the fi