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一、引言计算机系统普遍采用大规模集成电路以来,运算速度和能力大幅度提高,计算系统电路板上的逻辑和存贮电路的数目也不断增加。过去采用的手工测试的方法已不适应目前的发展,测试自动化和可测性设计的研究等已受到人们的重视。
I. INTRODUCTION Since the widespread adoption of large-scale integrated circuits in computer systems, the speed and capability of operation have been greatly improved. The number of logic and storage circuits on the computing system circuit board has also been on the rise. The manual test methods used in the past are not suitable for the current development. The research on test automation and testability design has drawn people’s attention.