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近年来,SnO_2超微粒子薄膜在气敏材料上的应用引起了人们极大的兴趣。薄膜的粒子大小和形状直接影响到它的性能。作者利用X射线宽化法测定了粒子的平均大小。自编程序可对衍射峰的K_α双线进行分离。又以碳化钨粉为标样制定了通用仪器宽度曲线,使测定比较迅速准确。从数据采集到分析计算可实现自动化。测定结果表明:在几个晶体学方向上,薄膜中的粒子平均大小均在百埃(10纳米)以内,符合超微粒子的要求。文章尚对晶格畸变的影响进行了探讨。
In recent years, the application of SnO 2 ultrafine particle film on gas-sensing materials has aroused great interest. The particle size and shape of the film directly affect its performance. The authors measured the average particle size using X-ray broadening. The self-programmed program can separate the K_α double lines of the diffraction peaks. And tungsten carbide powder as a standard sample developed a universal instrument width curve, the determination of more rapid and accurate. From data acquisition to analysis and calculation can be automated. The results show that in several crystallographic directions, the average size of the particles in the film is within 100 angstroms (10 nm), which meets the requirements of ultrafine particles. The article also on the lattice distortion effects were discussed.