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半导体温差电元件接触电阻和接触热阻是影响器件性能的重要参数，它们在很大程度上是器件制备工艺水平的反映。根据元件温差发电输出功率与元件电偶臂长度的相互关系模型，可以简单地通过测量系列化元件的开路电压和短路电流对接触特性作出评估。实测了两种不同来源的半导体制冷器以说明其实际应用。
Semiconductor thermoelectric contact resistance and contact resistance is an important parameter affecting the performance of the device, which is largely a reflection of the level of device preparation process. Based on the model of the relationship between the output power of the element thermoelectric power generation and the length of the galvanic element, the contact characteristics can be evaluated simply by measuring the open circuit voltage and the short-circuit current of the series element. Two different types of semiconductor refrigerators were measured to illustrate their practical application.