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从计算机长期工作中淘汰下来的组件,有一个普遍的问题,就是输入电流I_λ增加。I_λ增加引起了前级输出高电平降低,甚至不能工作。在100只组件中经高温贮存、加速寿命试验之后,失效的组件有18只。其中除有一只低电平V。抬高外,其余均为I_λ增大。有个别组件由于I_λ过大(>500μa)而完全失效。沟道电流是I_λ增大的主要原因。我们对I_λ增大的组件进行了解剖分析,对I_λ增大的机理作了探讨。因此,我们试验了用磷处理
A common problem eliminated from the long-term work of a computer is the increase of the input current I_λ. The increase of I_λ causes the output level of the previous stage to decrease, which can not even work. After 100 components were stored at high temperature, accelerated life test, there are 18 failed components. In addition to a low level V. Elevated, the rest are I_λ increased. There are individual components that fail completely because I_λ is too large (> 500μa). The channel current is the main reason for the increase of I_λ. We analyzed the component with increasing I_λ and discussed the mechanism of increasing I_λ. Therefore, we tested with phosphorus treatment