论文部分内容阅读
Field Programmable Gate Arrays(FPGAs)offer high capability in implementing of complex systems,and currently are an attractive solution for space system electronics.However,FPGAs are susceptible to radiation induced Single-Event Upsets(SEUs).To insure reliable operation of FPGA based systems in a harsh radiation environment,various SEU mitigation techniques have been provided.In this paper we propose a system based on dynamic partial reconfiguration capability of the modern devices to evaluate the SEU fault effect in FPGA.The proposed approach combines the fault injection controller with the host FPGA,and therefore the hardware complexity is minimized.All of the SEU injection and evaluation requirements are performed by a soft-core which realized inside the host FPGA.Experimental results on some standard benchmark circuits reveal that the proposed system is able to speed up the fault injection campaign 50 times in compared to conventional method.
Field Programmable Gate Arrays (FPGAs) offer high capability in implementing of complex systems, and currently are attractive solutions for space system electronics. Yet, FPGAs are susceptible to radiation induced Single-Event Upsets (SEUs). To insure reliable operation of FPGA based systems in a harsh radiation environment, various SEU mitigation techniques have been provided. This paper we propose a system based on dynamic partial reconfiguration capability of the modern devices to evaluate the SEU fault effect in FPGA. The proposed approach combines the fault injection controller with the host FPGA, and therefore the hardware complexity is minimized. All of the SEU injection and evaluation requirements are performed by a soft-core which realized inside the host FPGA. Experimental results on some standard benchmark circuits reveal that the proposed system is capable to speed up the fault injection campaign 50 times in compared to conventional method.