Accelerated Degradation Reliability Modeling and Test Data Statistical Analysis of Aerospace Electr

• 作 者: CHEN Wenhua LIU Juan GAO Liang
• 机 构: TheStateKeyLabofFluidPowerTransmissionandControl,SchoolofMechanicalandAutomaticControl,HangzhouAeros
• 出 处: 中国机械工程学报
• 发表日期: 2011年6期
• 关键词: 航天电连接器 统计分析方法 可靠性建模 退化数据 测试数据 时间序列分析方法 加速寿命试验 可靠性评估 electrical connector perfor
• 基金项目: This project is supported by National Nalural Science Foundation of China （Grant No. 50935002, Grant No. 51075370, Grant No. 51105341）, National Hi-tech Research and Development Program of China （863

As few or no failures occur during accelerated life test,it is difficult to assess reliability for long-life products with traditional life tests.Reliability assessment using degradation data of product performance over time becomes a significant approach