普通小麦杂交中上位性的测定

• 作 者: Sher Singhoda 魏莉
• 出 处: 麦类作物学报
• 发表日期: 1986年02期
• 关键词: 上位性 小麦杂交 Singh 遗传模式 测交 连续变异 小穗 无偏估计 抽穗期 组分

众所周知,小麦是存在有上位性的,然而大多数用于估计连续变异组分的遗传模式均假设上位性不存在(Singh等,1976;Ketata等,1976;Singh,1981).三重侧交(TTC)法(Kearsey等,1968)不仅为上位性提供了精确的测定方法,而且即使在没有上位性的情况下也可对加性(D)和显性(H)组分做出无偏估计.因此,我们用三重测交法对一个普通小麦的杂交组合进行了上位性测定的试验.

It is well-known that wheat is epistatic, however most of the genetic models used to estimate the components of the continuous variation all assume no epistasis (Singh et al., 1976; Ketata et al., 1976; Singh, 1981) ) Method (Kearsey et al., 1968) provides not only accurate measurements of epistasis but also unbiased estimates of additive (D) and dominant (H) components even in the absence of epistasis. Therefore, we tested the epistasis of a cross combination of common wheat with the triple test method.