论文部分内容阅读
Exploring and controlling the physical factors that determine the topography of thin liquid dielectric films are of interest in manifold fields of research in physics,applied mathematics,and engineering and have been a key aspect of many technological advancements.Visualization of thin liquid dielectric film topography and local thickness measurements are essential tools for characterizing and interpreting the underlying processes.However,achieving high sensitivity with respect to subnanometric changes in thickness via standard optical methods is challenging.We propose a combined imaging and optical patteing projection platform that is capable of optically inducing dynamical flows in thin liquid dielectric films and plasmonically resolving the resulting changes in topography and thickness.In particular,we employ the thermocapillary effect in fluids as a novel heat-based method to tune plasmonic resonances and visualize dynamical processes in thin liquid dielectric films.The presented results indicate that lightinduced thermocapillary flows can form and translate droplets and create indentation pattes on demand in thin liquid dielectric films of subwavelength thickness and that plasmonic microscopy can image these fluid dynamical processes with a subnanometer sensitivity along the vertical direction.