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一、前言用 Schering 电桥进行高压电容和损耗因数测量的常规方法,自1920年以来早已众所周知。在其应用的63年时间内该电桥被证明具有良好的稳定度和精确度。在1:1的 c_X:c_N 比率下,电容测量精确度优于10~(-4),tanδ的绝对误差小于1～3×10~(-5)。其它量限误差较大。高压
I. INTRODUCTION The conventional method of measuring high-voltage capacitors and loss factors with Schering bridges has long been known since 1920. The bridge proved to have good stability and accuracy over 63 years of its application. The capacitance measurement accuracy is better than 10 ~ (-4) at 1: 1 ratio of c_X: c_N, and the absolute error of tanδ is less than 1 ~ 3 × 10 ~ (-5). Other error limits larger. high pressure