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X光电子谱在固体表面成分分析及表面电子能态的研究中具有非常重要的地位。但是除了使用单色器或以同步辐射源为光源的X光电子谱外,一般来说它的分辨率比较低。为了更好地提高谱的分辨率,从谱中获得有用的讯息,必须对实验数据进行必要的数据处理。如果设f~t(E)是真实的X光电子谱,由于实验中所使用的X光并非是单色光而具有一定的光谱分布B_1(hv),因此非单色X光所产生的光电子谱将是这里*表示卷积运算,即
X-ray photoelectron spectroscopy plays an important role in the composition analysis of solid surface and the study of surface electron energy states. But apart from the use of a monochromator or a synchrotron radiation source for the X-ray photoelectron spectrum, the resolution is generally lower. In order to improve the resolution of the spectrum better and obtain the useful information from the spectrum, the necessary data processing of the experimental data must be performed. If f ~ t (E) is a true X-ray photoelectron spectrum, since the X-ray used in the experiment is not a monochromatic light and has a certain spectral distribution B_1 (hv), the photoelectron spectrum generated by the non-monochromatic X-ray Will be here * Indicates convolution operation, that is