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美帝麻省理工学院林肯实验室的研究人员用激光来分析集成电路中各个元器件的性能。由于集成电路已被当作快速调换部分一样地看待,它们的性能只能在输入端和输出
Researchers at the Massachusetts Institute of Technology Lincoln Laboratory use lasers to analyze the performance of various components in integrated circuits. Since integrated circuits have been treated as part of a quick swap view, their performance can only be at the input and output