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时序电路的测试生成非常复杂。时序电路的可测性设计对于指导电路设计及测试生成是十分重要的。基于对在测试生成过程中的难测故障进行冲突分析,提出了一种新的评价电路可测性的测度conflict+,并在此基础上提出了一种两阶段的非扫描可测性设计方法。这种新的测度可以体现出时序ATPG中的绝大部分特征。运用该方法对一些实验电路进行可测性设计后,结果表明比近期的两种非扫描可测性设计方法nscan和lcdft在故障覆盖率、测试效率等方面都取得了更好的效果。
Timing circuit test generation is very complicated. The testability design of the timing circuit is very important for the design and test generation of the guidance circuit. Based on the conflict analysis of the unpredictable faults in the test generation process, a new measure conflict + of the evaluation circuit is proposed. Based on this, a two-stage non-scan testable design method is proposed. This new measure reflects most of the features in temporal ATPG. Using this method to design the testability of some experimental circuits, the results show that nscan and lcdft have achieved better results in terms of fault coverage and test efficiency than the two recent non-scanability test methods nscan and lcdft.