A digital CDS technique and its performance testing

• 作 者: 刘晓艳 陆景彬 杨彦佶 陆波 王于仨 徐玉朋 崔苇苇 李炜 李茂顺 王娟 韩大炜 陈田祥 霍嘉 胡渭 张艺 朱玥 张子良 尹国和 王宇 赵仲毅 付艳红 张娅 马克岩 陈勇
• 机 构: College of Physics,Jilin University,Key Laboratory of Particle Astrophysics,Institute of High Energy
• 出 处: Chinese Physics C
• 发表日期: 2015年07期
• 关键词: readout inevitably operational analog noisy characterizing reset irradiation amp

Readout noise is a critical parameter for characterizing the performance of charge-coupled devices(CCDs), which can be greatly reduced by the correlated double sampling(CDS) circuit. However, a conventional CDS circuit inevitably introduces new noise since it consists of several active analog components such as operational amplifiers. This paper proposes a digital CDS circuit technique, which transforms the pre-amplified CCD signal into a train of digital presentations by a high-speed data acquisition card directly without the noisy CDS circuit,then implements the digital CDS algorithm through a numerical method. A readout noise of 3.3 e- and an energy resolution of 121 e V@5.9 ke V can be achieved via the digital CDS technique.

However, a conventional CDS circuit inevitably introduces new noise since it consists of several active analog components such as operational amplifiers. This paper proposes a digital CDS circuit technique, which transforms the pre-amplified CCD signal into a train of digital presentations by a high-speed data acquisition card without the noisy CDS circuit, then implements the digital CDS A readout noise of 3.3 e- and an energy resolution of 121 e V@5.9 ke V can be achieved via the digital CDS technique.