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BIT虚警率是影响BIT正常使用的主要问题之一。与电子系统相比,由于机电设备的功能和结构的复杂性使得其测试性问题更复杂,其中的虚警问题更加突出。本文以机电设备BIT系统为背景,基于BIT系统处理流程对虚警率的进行建模,并对其影响因素进行系统分析。提出BIT虚警率的分析模型,基于该模型分析结果,为降低BIT系统中的虚警率,提出嵌入数据异常检测和恢复功能的BIT改进模型,并证明了该模型的有效性,导出改进模型中影响虚警率的主要特性参数,从而为实现降低虚警率的技术研究提供理论指导。
BIT false alarm rate is one of the main problems affecting the normal use of BIT. Compared with the electronic system, due to the complexity of the function and structure of the mechanical and electrical equipment, the testing problem is more complicated, and the false alarm problem becomes more prominent. Based on BIT system of electromechanical equipment, this paper models the false alarm rate based on the process of BIT system and systematically analyzes its influencing factors. Based on the results of the model analysis, in order to reduce the false alarm rate in BIT system, a BIT improved model with embedded data anomaly detection and recovery function is proposed. The validity of this model is proved and the improved model Which will affect the false alarm rate of the main characteristics of the parameters, so as to reduce the false alarm rate to provide technical guidance to provide theoretical guidance.