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Solid electrolytes Ce0.8Sm0.2–xPrxO2–δ(x=0.02, 0.04, 0.06, 0.08) were prepared by citric-nitrate method. The microstructure and electrical properties of such materials were examined by X-ray diffraction(XRD), atomic force microscopy(AFM), Raman spectroscopy(Raman), X-ray photoelectron spectroscopy(XPS) and impedance spectroscopy analyses. Specifically, results from XRD analysis showed that samples calcined at 800 oC for 4 h possessed single-phase cubic fluorite structure, and the average grain size was found to be 36–45 nm. Further Raman spectral analysis indicated that oxygen vacancies should be present in the cubic fluorite structure of Ce0.8Sm0.12Pr0.08O2–δ, and Pr-doping seemed to increase their concentration significantly. AFM images showed that the grain size grew with the increase of Pr substitution. XPS analysis confirmed the existence of oxygen vacancies in the lattice of Ce0.8Sm0.12Pr0.08O2–δ in which Pr3+ and Pr4+ co-existed. AC impedance spectra indicated that the conductivity of Ce0.8Sm0.2–xPrxO2–δincreased with the increase of Pr-doping but the conduction activation energy decreased. Notably, it appeared that sample Ce0.8Sm0.12Pr0.08O2–δ(σ600 oC=1.21×10–2 S/cm, Ea=0.77 e V) exhibited conductivity superior to Ce0.8Sm0.2O1.9(σ600 oC=2.22×10–3 S/cm, Ea=1.02 e V) because it possessed higher conductivity and lower activation energy. At 600 oC, the conductivity of Ce0.8Sm0.12Pr0.08O2–δwas 4.45 times higher than that of the un-doped material.
The microstructure and electrical properties of such materials were examined by X-ray diffraction (XRD), atomic force microscopy (AFM), Raman spectroscopy (Raman), X-ray photoelectron spectroscopy (XPS) and impedance spectroscopy analyzes. Specifically, results from XRD analysis showed that samples calcined at 800 oC for 4 h possessed single-phase cubic fluorite structure, and the average grain size was found to be 36-45 nm. Further Raman spectral analysis showed that oxygen vacancies should be present in the cubic fluorite structure of Ce 0.8 Si0.12 Pr0.08 O2-δ, and Pr-doping seemed to increase their concentration . AFM images showed that the grain size was increased with the increase of Pr substitution. XPS analysis confirmed the existence of oxygen vacancies in the lattice of Ce 0.8Sm 0.12 Pr 0.08 O2-δ in which Pr 3+ and Pr 4 + co-existed. AC impedance spectra that the conductivity of Ce0.8Sm0.2-xPrxO2-δincreased with the increase of Pr-doping but the conduction activation energy decreased. Notably, it has found that sample Ce0.8Sm0.12Pr0.08O2-δ (σ600 oC = 1.21 × 10-2 S / cm, Ea = 0.77 eV) indicating conductivity to Ce0.8Sm0.2O1.9 (σ600 oC = 2.22 × 10 -3 S / cm, Ea = 1.02 e V) because it possessed higher conductivity and lower activation energy. At 600 oC, the conductivity of Ce0.8Sm0.12Pr0.08O2-δ was 4.45 times higher than that of the un-doped material.