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中国仪器仪表学会机械量测试仪器学会于一九八○年十一月二十八日在宁波市召开了“光电测试技术学术讨论会”。参加会议的有全国各高等院校、研究机关、工矿企业等系统的37个单位共59名代表。会上共收到论文50篇,内容涉及光栅机理、电子细分、系统设计、光栅应用技术以及莫尔等高测量、激光应用等多方面的文章,内容较为丰富,且具有一定的水平。现选录其中一部份论文的摘要于下,供读者参考。
China Institute of Instrumentation Society of mechanical measurement instrumentation in November 28, 1980 in Ningbo City, held a “Photoelectric Test Technology Symposium.” There were 59 representatives from 37 units of various institutions of higher learning, research institutions, industrial and mining enterprises in the country participating in the conference. A total of 50 papers were received at the conference, covering various aspects such as grating mechanism, electronic subdivision, system design, grating application technology and Moiré measurements, laser applications and other articles, which are rich in content and have a certain level. Now select the summary of some of the papers below, for readers reference.