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对薄层地震响应的振幅、频谱等特征进行了详细的分析，并分析了影响该地震响应波形特征的因素。同时，利用积分能谱技术对其进行处理，可以识别出薄层的厚度变化及透镜体的存在。实际应用表明，该项技术较常规的时频分析方法有更高的分辨能力。
The characteristics of amplitude and frequency spectrum of thin-layer seismic response are analyzed in detail, and the factors affecting the waveform characteristics of the seismic response are analyzed. At the same time, the use of integral energy spectrum technology to deal with it, you can identify changes in the thickness of the thin layer and the presence of the lens body. Practical application shows that the technology has higher resolution than the conventional time-frequency analysis method.