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对两种基于反馈的自测试（BIST）方案进行了比较研究,给出了串行反馈和并行反馈BIST方案的设计结构和操作模式。分析了它们的状态转移图的拓扑结构,并对若干电路做了模拟实验。研究表明:添加线沟通测试图生成和响应压缩部分所产生的串行反馈BIST方案性能更好。
The two feedback-based self-test (BIST) schemes are compared and the design structure and operation mode of serial feedback and parallel feedback BIST scheme are given. The topology structure of their state transition diagram is analyzed, and several circuits are simulated. The research shows that the performance of the serial feedback BIST scheme generated by adding line communication test patterns and responding to the compression part is better.