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以正丁醉钛和硝酸铋为原料，用Sol－Gel技术分别在Pt／Ti／Si／、Si、Y－ZrO2、SrTiO3（100）和石英玻璃基片上生长出C轴取向的Bi4Ti3O12薄膜．研究了衬底材料表面结构对Bi4Ti312薄膜取向度的影响．晶格失配能和Bi4Ti3O12晶体的晶面能决定了薄膜的取向程度.
The C-axis oriented Bi4Ti3O12 thin films were grown on Pt / Ti / Si /, Si, Y-ZrO2, SrTiO3 (100) and quartz glass substrates by using Sol-Gel technology with n-butyl boride and bismuth nitrate as raw materials. The effect of the surface structure of the substrate on the orientation of Bi4Ti312 films was investigated. The lattice mismatch energy and the crystal plane of Bi4Ti3O12 crystal can determine the degree of orientation of the film.