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A systematic investigation of oxidation on a superconductive Fe Te_(0.5)Se_(0.5)thin film,which was grown on Nb-doped SrTiO_3(001) by pulsed laser deposition,has been carried out.The sample was exposed to ambient air for one month for oxidation.Macroscopically,the exposed specimen lost its superconductivity due to oxidation.The specimen was subjected to in situ synchrotron radiation photoelectron spectroscopy(PES) and x-ray absorption spectroscopy(XAS) measurements following cycles of annealing and argon ion etching treatments to unravel what happened in the electronic structure and composition after exposure to air.By the spectroscopic measurements,we found that the as-grown FeTe_(0.5)Se_(0.5)superconductive thin film experienced an element selective substitution reaction.The oxidation preferentially proceeds through pumping out the Te and forming Fe–O bonds by O substitution of Te.In addition,our results certify that in situ vacuum annealing and low-energy argon ion etching methods combined with spectroscopy are suitable for depth element and valence analysis of layered structure superconductor materials.
A systematic investigation of oxidation on a superconductive Fe Te_ (0.5) Se_ (0.5) thin film, which was grown on Nb-doped SrTiO_3 (001) by pulsed laser deposition, has been carried out. The sample was exposed to ambient air for one month for oxidation. Macroscopically, the exposed specimen lost its superconductivity due to oxidation. specimen was subjected to in situ synchrotron radiation photoelectron spectroscopy (PES) and x-ray absorption spectroscopy (XAS) measurements following cycles of annealing and argon ion etching treatments to unravel what happened in the electronic structure and composition after exposure to air.By the spectroscopic measurements, we found that the as-grown FeTe_ (0.5) Se_ (0.5) superconductive thin film experienced an element selective substitution reaction. The oxidation preferentially through through pumping out the Te and forming Fe-O bonds by O substitution of Te. addition, our results certify that in situ vacuum annealing and low-energy argon ion etching methods combined with spectroscopy are suitable for depth element and valence analysis of layered structure superconductor materials.