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Microstructural characteristics in the BaSrNb_(0.3)Ti_(0.7)O_3 thin film,grown on SrTiO_3 substrate by computer- controlled laser molecular beam epitaxy,were characterized by means of transmission electron microscopy (TEM).It is found that the film is single-crystallized and epitaxially grown on the SrTiO_3 substrate forming a flat and distinct interface.Anti-phase domains were identified,and the crystallographic features of mismatch dislocations at the interface between film and substrate were clarified.The high conductivity of the present film was discussed from the viewpoint of Nb dopant and the nitrogen atmosphere.
Microstructural characteristics in the BaSrNb_ (0.3) Ti 0.7 O_3 thin film, grown on SrTiO_3 substrate by computer-controlled laser molecular beam epitaxy, were characterized by means of transmission electron microscopy (TEM). It is found that the film is single- crystallized and epitaxially grown on the SrTiO_3 substrate forming a flat and distinct interface. Anti-phase domains were identified, and the crystallographic features of mismatch dislocations at the interface between film and substrate were clarified. The high conductivity of the present film was discussed from the viewpoint of Nb dopant and the nitrogen atmosphere.