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A novel Time-Interleaved Analog-to-Digital Converter (TIADC) digital background calibration for the mismatches of offsets, gain errors, and timing skews based on split-ADC is proposed. Firstly, the split-ADC channels in present TIADC architecture are designed to convert input signal at two different channel sampling rates so that redundant channel to facilitate pair permutation is avoided. Secondly, a high-order compensation scheme for correction of timing skew error is employed for effective calibration to preserve high-resolution when input frequency is high. Numerical simulation performed by MATLAB for a 14-bit TIADC based on 7 split-ADC channels shows that Signal-to-Noise and Distortion Ratio (SNDR) and Spurious Free Dynamic Range (SFDR) of the TIADC achieve 86.2 dBc and 106 dBc respectively after calibration with normalized input frequency near Nyquist frequency.
A novel Time-Interleaved Analog-to-Digital Converter (TIADC) digital background calibration for the mismatches of offsets, gain errors, and timing skews based on split-ADC is proposed. To convert an input signal at two different channel sampling rates so that redundant channels to facilitate pair permutation are avoided. . Numerical simulation performed by MATLAB for a 14-bit TI ADC based on 7 split-ADC channels shows that Signal-to-Noise and Distortion Ratio (SNDR) and Spurious Free Dynamic Range (SFDR) of the TIADC achieve 86.2 dBc and 106 dBc respectively after calibration with normalized input frequency near Nyquist frequency.